Christopher L. Henderson
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
6
Venues
1
Active years
1991–1997
Best venue rank
A
Where they publish
Papers
6 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1997 | ITC | Transient Power Supply Voltage (V | Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins |
| 1997 | ITC | Signature Analysis for IC Diagnosis and Failure Analysis. | Christopher L. Henderson, Jerry M. Soden |
| 1997 | ITC | IC Diagnosis: Industry Issues. | Jerry M. Soden, Christopher L. Henderson |
| 1996 | ITC | IC Failure Analysis Tools and Techniques - Macig, Mystery, and Science. | Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson |
| 1992 | ITC | Economic Impact of Type I Test Errors at System and Board Levels. | Christopher L. Henderson, Richard H. Williams, Charles F. Hawkins |
| 1991 | ITC | The Behavior and Testing Implications of CMOS IC Logic Gate Open Circuits. | Christopher L. Henderson, Jerry M. Soden, Charles F. Hawkins |