David J. Mulligan
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2007–2007
Best venue rank
National
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2007 | VLSID | Fault Models and Device Yield of a Large Population of Room Temperature Operation Single-Electron Transistors. | Daniel Mazor, Michael L. Bushnell, David J. Mulligan, Richard J. Blaikie |