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David J. Wharton

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

3

Venues

2

Active years

1983–1989

Best venue rank

A

Where they publish

Papers

3 indexed papers, newest first.

YearVenueTitleAuthors
1989ICCADHigh performance test generation for accurate defect models in CMOS gate array technology.Hector R. Sucar, Susheel J. Chandra, David J. Wharton
1989ITCCrossCheck: A Practical Solution for ASIC Testability.George Swan, Yatin Trivedi, David J. Wharton
1983ITCThe HITEST Test Generation System Overview.David J. Wharton