David R. Akeson
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
1998–1998
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1998 | ITC | Testability access of the high speed test features in the Alpha 21264 microprocessor. | Dilip K. Bhavsar, David R. Akeson, Michael K. Gowan, Daniel B. Jackson |
| 1998 | ITC | A highly testable and diagnosable fabrication process test chip. | Dilip K. Bhavsar, Ugonna Echeruo, David R. Akeson, William J. Bowhill |