Detlev Richter
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
2
Active years
1998–2003
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2003 | DATE | Optimizing Stresses for Testing DRAM Cell Defects Using Electrical Simulation. | Zaid Al-Ars, Ad J. van de Goor, Jens Braun, Detlev Richter |
| 2001 | ITC | Simulation based analysis of temperature effect on the faulty behavior of embedded DRAMs. | Zaid Al-Ars, Ad J. van de Goor, Jens Braun, Detlev Richter |
| 1998 | ITC | How we test Siemens Embedded DRAM Cores. | Roderick McConnell, Udo Mller, Detlev Richter |