Dinesh D. Gaitonde
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
1993–1993
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1993 | ICCAD | Test quality and yield analysis using the DEFAM defect to fault mapper. | Dinesh D. Gaitonde, Duncan M. Hank Walker |
| 1993 | VTS | Estimation of reject ratio in testing of combinatorial circuits. | Dinesh D. Gaitonde, Jitendra Khare, D. M. H. Walker, Wojciech P. Maly |