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Dominic F. Haigh

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

2

Venues

1

Active years

1994–1997

Best venue rank

A

Where they publish

Papers

2 indexed papers, newest first.

YearVenueTitleAuthors
1997ITCWhy Automate Optical Inspection?Douglas W. Raymond, Dominic F. Haigh
1994ITCNon-Volatile Programmable Devices and In-Circuit Test.Douglas W. Raymond, Dominic F. Haigh, Ray Bodick, Barbara Ryan, Dale McCombs