Edwin Walter Reid
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
1
Active years
2005–2008
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2008 | ITC | Non-contact Testing for SoC and RCP (SIPs) at Advanced Nodes. | Brian Moore, Marc Mangrum, Chris Sellathamby, Md. Mahbub Reja, T. Weng, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, Steven Slupsky |
| 2007 | ITC | High throughput non-contact SiP testing. | Brian Moore, Chris Sellathamby, Philippe Cauvet, Hrv Fleury, M. Paulson, Md. Mahbub Reja, Lin Fu, Brenda Bai, Edwin Walter Reid, Igor M. Filanovsky, Steven Slupsky |
| 2005 | ITC | Noncontact wafer probe using wireless probe cards. | Chris Sellathamby, Md. Mahbub Reja, Lin Fu, Brenda Bai, Edwin Walter Reid, Steven Slupsky, Igor M. Filanovsky, Kris Iniewski |