Eon-Jo Byunb
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2008–2008
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2008 | ITC | Wafer-Level Characterization of Probecards using NAC Probing. | Gyu-Yeol Kim, Eon-Jo Byunb, Ki-Sang Kang, Young-Hyun Jun, Bai-Sun Kong |