Eric Bruls
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
6
Venues
1
Active years
1991–1996
Best venue rank
A
Where they publish
Papers
6 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1996 | ITC | Test Quality of Asynchronous Circuits: A Defect-oriented Evaluation. | Marly Roncken, Eric Bruls |
| 1994 | ITC | Variable Supply Voltage Testing for Analogue CMOS and Bipolar Circuits. | Eric Bruls |
| 1994 | ITC | Analogue Fault Simulation Based on Layout-Dependent Fault Models. | R. J. A. Harvey, Andrew Mark David Richardson, Eric Bruls, Keith Baker |
| 1993 | ITC | Parameter Monitoring: Advantages and Pitfalls. | M. M. A. van Rosmalen, Keith Baker, Eric Bruls, Jochen A. G. Jess |
| 1992 | ITC | Bridging Defects Resistance Measurements in a CMOS Process. | Rosa Rodrguez-Montas, Joan Figueras, Eric Bruls |
| 1991 | ITC | A Generic Method to Develop a Defect Monitoring System for IC Processes. | Eric Bruls, F. Camerik, H. J. Kretschman, Jochen A. G. Jess |