Eugene R. Hnatek
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
8
Venues
1
Active years
1981–1995
Best venue rank
A
Where they publish
Papers
8 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1995 | ITC | User Application of Statistical Process Monitor Techniques to ASIC Critical Parameters. | Alex M. Ijaz, Eugene R. Hnatek |
| 1993 | ITC | Application of Statistical Techniques to Critical System Parameters. | Rick Boyle, Jack Donovan, Eugene R. Hnatek, Alex M. Ijaz |
| 1989 | ITC | Quality Issues of High Pin Count Fine Pitch VLSI Packages. | Eugene R. Hnatek, Billy R. Livesay |
| 1986 | ITC | IC Burn-In : The Changing Scene. | Eugene R. Hnatek |
| 1984 | ITC | Thoughts on VLSI Burn-in. | Eugene R. Hnatek |
| 1984 | ITC | Problems Encountered in Developing VLSI Test Programs for COT (A Practical Outlook). | Beau R. Wilson Jr., Eugene R. Hnatek |
| 1982 | ITC | An Evaluation of the 2816 EEPROM. | Eugene R. Hnatek, Beau R. Wilson Jr. |
| 1981 | ITC | Documentation for Testability : The Supplier's Responsibility to the User. | Eugene R. Hnatek |