F. Camerik
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
1989–1991
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1991 | ITC | A Generic Method to Develop a Defect Monitoring System for IC Processes. | Eric Bruls, F. Camerik, H. J. Kretschman, Jochen A. G. Jess |
| 1989 | ITC | Qualification and Quantification of Process-Induced Product-Related Defects. | F. Camerik, P. A. J. Dirks, Jochen A. G. Jess |