Feng-Hsien Warren Shih
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1983–1983
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1983 | ITC | Real-Time Product Characterization by Fault Modeling and Pattern Recognitions. | Feng-Hsien Warren Shih |