Frans P. M. Beenker
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
7
Venues
2
Active years
1985–1993
Best venue rank
A*
Where they publish
Papers
7 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1993 | ITC | Minimizing Test Time by Exploiting Parallelism in Macro Test. | Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker |
| 1992 | ITC | Macro Testability: The Results of Production Device Applications. | Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker |
| 1989 | ITC | A Testability Strategy for Silicon Compilers. | Frans P. M. Beenker, Rob Dekker, Rudi Stans, Max van der Star |
| 1988 | ITC | Fault Modeling and Test Algorithm Development. | Frans P. M. Beenker, Rob Dekker, Loek Thijssen |
| 1988 | ITC | A Realistic Self-Test Machine for Static Random Access Memories. | Frans P. M. Beenker, Rob Dekker, Loek Thijssen |
| 1986 | DAC | Design-for-testability of PLA's using statistical cooling. | Michiel M. Ligthart, Emile H. L. Aarts, Frans P. M. Beenker |
| 1985 | ITC | Systematic and Structured Methods for Digital Board Testing. | Frans P. M. Beenker |