Frederick L. Taber
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
1998–2004
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2004 | ITC | The Leading Edge of Production Wafer Probe Test Technology. | William R. Mann, Frederick L. Taber, Philip W. Seitzer, Jerry J. Broz |
| 1998 | ITC | An introduction to area array probing. | Frederick L. Taber |