Fu-Gin Chen
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1989–1989
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1989 | ITC | VLSI Package Reliability Risk Due to Accelerated Environmental Testing. | David Haupert, Fu-Gin Chen, David Lee |