Geewhun Seok
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2012–2012
Best venue rank
National
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2012 | VTS | Write-through method for embedded memory with compression Scan-based testing. | Geewhun Seok, Hong Kim, Baker Mohammad |