Gerald H. Johnson
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
1995–2000
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2000 | ITC | Challenges of high supply currents during VLSI test. | Gerald H. Johnson |
| 1995 | ITC | A General Purpose ATE Based I | Gerald H. Johnson, Jan B. Wilstrup |