Gordon B. Neish
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1982–1982
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1982 | ITC | An Algorithmic Approach to the Testing of a Wafer Scale Integrated (WSI) Circuit. | Neal H. MacDonald, Gordon B. Neish |