H. H. Kwan
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1984–1984
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1984 | ITC | A Built-In Test Methodology for VLSI Data Paths. | Charles R. Kime, H. H. Kwan, J. K. Lemke, Gerald B. Williams |