Hanno Melzner
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
2007–2014
Best venue rank
A*
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2014 | ITC | Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening. | Andreas Kux, Rudolf Ullmann, Thomas Kern, Roland Strunz, Hanno Melzner, Stephan Beuven, Andreas Haase |
| 2007 | DAC | Concurrent Wire Spreading, Widening, and Filling. | Olivier Rizzo, Hanno Melzner |