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Hans-Peter Feuerbaum

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

1988–1988

Best venue rank

A

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
1988ITCElectron Beam Tester Integrated into a VLSI Tester.Hironobu Niijima, Yasuo Tokunaga, Shouichi Koshizuka, Kazuo Yakuwa, Pter Fazekas, Mathias Sturm, Hans-Peter Feuerbaum