Heguo Yin
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2024–2024
Best venue rank
B
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2024 | ETS | Semiconductor Application Fail Root Causes And Secure Test Remedy. | Heguo Yin, Peter Poechmueller |