Herman J. Vermaak
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2001–2001
Best venue rank
B
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2001 | ETS | Reducing the susceptibility of design-for-delay-testability structures to process- and application-induced variations. | Herman J. Vermaak, Hans G. Kerkhoff |