Hideo Shibano
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
1977–1983
Best venue rank
A*
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1983 | ITC | A High Level Test Pattern Generation Algorithm. | Masato Kawai, Hideo Shibano, Shigehiro Funatsu, Shunichi Kato, T. Kurobe, K. Ookawa, Tohru Sasaki |
| 1977 | DAC | Automatic test generation for large digital circuits. | Akihiko Yamada, Nobuo Wakatsuki, Hideo Shibano, Osamu Itoh, Kyoji Tomita, Shigehiro Funatsu |