Hiren D. Thacker
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2006–2006
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2006 | ITC | Prospects for Wafer-Level Testing of Gigascale Chips with Electrical and Optical I/O Interconnects. | Hiren D. Thacker, James D. Meindl |