I. D. Dear
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
4
Venues
2
Active years
1986–1993
Best venue rank
A
Where they publish
Papers
4 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1993 | ICCD | Economics in Design and Test. | Chryssa Dislis, Anthony P. Ambler, I. D. Dear, J. H. Dick |
| 1993 | ITC | Economics Modelling for the Determination of Test Strategies for Complex VLSI Boards. | Chryssa Dislis, J. H. Dick, I. D. Dear, I. N. Azu, Anthony P. Ambler |
| 1989 | ITC | Cost Analysis of Test Method Environments. | Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler |
| 1986 | ITC | Economically Viable Automatic Insertion of Self-Test Features for Custom VLSI. | Mark Paraskeva, Anthony P. Ambler, D. F. Burrows, W. L. Knight, I. D. Dear |