J. L. Rainard
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1994–1994
Best venue rank
Unranked
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1994 | EDCC | Hierarchical Test Analysis of VLSI Circuits for Random BIST. | G. Masseboeuf, J. Pulou, J. L. Rainard |