J. Najm
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1995–1995
Best venue rank
National
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1995 | VTS | Cyclic stress tests for full scan circuits. | Vinay Dabholkar, Sreejit Chakravarty, J. Najm, Janak H. Patel |