J. R. Miles
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
1988–1989
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1989 | ITC | Cost Analysis of Test Method Environments. | Chryssa Dislis, I. D. Dear, J. R. Miles, S. C. Lau, Anthony P. Ambler |
| 1988 | ICCD | Estimation of area and performance overheads for testable VLSI circuits. | J. R. Miles, Anthony P. Ambler, K. A. E. Totton |