James C. Andersen
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2000–2000
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2000 | ITC | Reducing device yield fallout at wafer level test with electrohydrodynamic (EHD) cleaning. | Jerry J. Broz, James C. Andersen, Reynaldo M. Rincon |