Jayant D'Souza
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
4
Venues
1
Active years
2008–2025
Best venue rank
A
Where they publish
Papers
4 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2025 | ITC | Using Distinguishing Bits to Improve Chain Diagnosis Coverage for Silicon Defects. | Wu-Tung Cheng, Manish Sharma, Artur Stelmach, Jakub Janicki, Preston McWithey, Gaurav Veda, Szczepan Urban, Jayant D'Souza |
| 2025 | ITC | Advanced fault model, diagnosis and applications for deep nanometer process. | Youngseok Son, Muyun Cho, Hyunyul Lim, Jaeseok Park, Piotr Zimnowlodzki, Szczepan Urban, Jayant D'Souza, Manish Sharma |
| 2023 | ITC | Predicting the Resolution of Scan Diagnosis. | Manoj Devendhiran, Jakub Janicki, Szczepan Urban, Manish Sharma, Jayant D'Souza |
| 2008 | ITC | High Test Quality in Low Pin Count Applications. | Jayant D'Souza, Subramanian Mahadevan, Nilanjan Mukherjee, Graham Rhodes, Jocelyn Moreau, Thomas Droniou, Paul Armagnat, Damien Sartoretti |