Jeffrey L. Roehr
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
4
Venues
1
Active years
1999–2007
Best venue rank
A
Where they publish
Papers
4 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2007 | ITC | Measurement ratio testing for improved quality and outlier detection. | Jeffrey L. Roehr |
| 2006 | ITC | Very-Low Voltage (VLV) and VLV Ratio (VLVR) Testing for Quality, Reliability, and Outlier Detection. | Jeffrey L. Roehr |
| 2005 | ITC | The case for outsourcing DFT. | Jeffrey L. Roehr |
| 1999 | ITC | Thin Gate Oxide Reliability. | Jeffrey L. Roehr |