Jens Braun
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
2001–2003
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2003 | DATE | Optimizing Stresses for Testing DRAM Cell Defects Using Electrical Simulation. | Zaid Al-Ars, Ad J. van de Goor, Jens Braun, Detlev Richter |
| 2001 | ITC | Simulation based analysis of temperature effect on the faulty behavior of embedded DRAMs. | Zaid Al-Ars, Ad J. van de Goor, Jens Braun, Detlev Richter |