Jerry J. Broz
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
1
Active years
1999–2004
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2004 | ITC | The Leading Edge of Production Wafer Probe Test Technology. | William R. Mann, Frederick L. Taber, Philip W. Seitzer, Jerry J. Broz |
| 2000 | ITC | Reducing device yield fallout at wafer level test with electrohydrodynamic (EHD) cleaning. | Jerry J. Broz, James C. Andersen, Reynaldo M. Rincon |
| 1999 | ITC | Probe contact resistance variations during elevated temperature wafer test. | Jerry J. Broz, Reynaldo M. Rincon |