Jim Crafts
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2016–2016
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2016 | ITC | Active reliability monitor: Defect level extrinsic reliability monitoring on 22nm POWER8 and zSeries processors. | Michael Johnson, Brian Noble, Mark Johnson, Jim Crafts, Cynthia Manya, John Deforge |