Jiri Nosek
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
2000–2001
Best venue rank
C
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2001 | IOLTS | Test-per-Clock Testing of the Circuits with Scan. | Ondrej Novk, Jiri Nosek |
| 2000 | IOLTS | On Using Deterministic Test Sets in BIST. | Ondrej Novk, Jiri Nosek |