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Joe Obedowski

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

2025–2025

Best venue rank

A

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
2025ITCWhy is Rigorous PCIe LTSSM Testing a Key to Robust and Reliable Systems?Sean Chen, Amarildo Garcia, Frank Chang, Joe Obedowski, Victor Castillo