Joe Wrinn

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

Venues

Active years

1995–1996

Best venue rank

Where they publish

2 indexed papers, newest first.

Year	Venue	Title	Authors
1996	ITC	Two New Techniques for Identifying Opens on Printed Circuit Boards: Analog Junction Test, and Radio Frequency Induction Test.	Joe Wrinn
1995	ITC	Two New Techniques for Identifying Opens on Printed Circuit Boards: Analog Junction Test & Radio Frequency Induction Test.	Joe Wrinn