Johan Verfaillie
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
1999–2003
Best venue rank
B
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2003 | ETS | Debug architecture for system on chip taking full advantage of the test access port. | Erik Moerman, Sbastien Bocq, Johan Verfaillie |
| 1999 | ETS | Application of supply current testing to analogue circuits, towards a structural analogue test methodology. | Hans A. R. Manhaeve, Johan Verfaillie, B. Straka, J. P. Cornil |