John C. Howland
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
1983–1983
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1983 | ITC | Turning Test Data into Information. | Pat T. Harding, John C. Howland |
| 1983 | ITC | Estimating the Required Size of an Automated Test and Repair System from Subassembly Volume and Failure Information. | John C. Howland, Pat T. Harding |