John C. Pagano
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1985–1985
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1985 | ITC | Backdrive Stress-Testing of CMOS Gate Array Circuits. | Frank H. Hielscher, John C. Pagano |