John S. Davis
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
1
Active years
1998–2003
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2003 | ITC | Application and Demonstration of a Digital Test Core: Optoelectronic Test Bed and Wafer-level Prober. | John S. Davis, David C. Keezer, Odile Liboiron-Ladouceur, Keren Bergman |
| 2002 | ITC | Multi-Purpose Digital Test Core Utilizing Programmable Logic. | John S. Davis, David C. Keezer |
| 1998 | ITC | Improved sensitivity for parallel test of substrate interconnections. | David C. Keezer, K. E. Newman, John S. Davis |