John Van Slyke
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
2004–2007
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2007 | ITC | Silicon evaluation of longest path avoidance testing for small delay defects. | Ritesh P. Turakhia, W. Robert Daasch, Mark Ward, John Van Slyke |
| 2004 | ITC | Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. | Brady Benware, Cam Lu, John Van Slyke, Prabhu Krishnamurthy, Robert Madge, Martin Keim, Mark Kassab, Janusz Rajski |