Jon Vollmar
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
2008–2010
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2010 | ITC | Automated test program generation for automotive devices. | Anke Drappa, Peter Huber, Jon Vollmar |
| 2008 | ITC | Leveraging IEEE 1641 for Tester-Independent ATE Software. | Bethany Van Wagenen, Jon Vollmar, Dan Thornton |