Jun Saitou
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1995–1995
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1995 | ITC | A Gate-Array-Based 666MHz VLSI Test System. | Shuji Kikuchi, Yoshihiko Hayashi, Takashi Suga, Jun Saitou, Masahiko Kaneko, Takashi Matsumoto, Ryozou Yoshino |