Junichi Hirase
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
1995–1995
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1995 | ITC | Improvement of the Defect Level of Micro-computer LSI Testing. | Junichi Hirase |
| 1995 | ITC | Study on the Costs of On-site VLSI Testing. | Junichi Hirase |