Justyna Zawada
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
8
Venues
3
Active years
2014–2020
Best venue rank
A*
Where they publish
Papers
8 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2020 | ITC | Test Challenges of Intel IA Cores. | Uri Shpiro, Khen Wee, Kun-Han Tsai, Justyna Zawada, Xijiang Lin |
| 2020 | ITC | Prediction of Test Pattern Count and Test Data Volume for Scan Architectures under Different Input Channel Configurations. | Fong-Jyun Tsai, Chong-Siao Ye, Kuen-Jong Lee, Shi-Xuan Zheng, Yu Huang, Wu-Tung Cheng, Sudhakar M. Reddy, Mark Kassab, Janusz Rajski, Chen Wang, Justyna Zawada |
| 2018 | ITC | On New Class of Test Points and Their Applications. | Janusz Rajski, Jerzy Tyszer, Justyna Zawada |
| 2017 | ITC | Full-scan LBIST with capture-per-cycle hybrid test points. | Sylwester Milewski, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada |
| 2016 | ITC | Test point insertion in hybrid test compression/LBIST architectures. | Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada |
| 2015 | DAC | Design for low test pattern counts. | Haluk Konuk, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Deepak Solanki, Jerzy Tyszer, Justyna Zawada |
| 2015 | ITC | Embedded deterministic test points for compact cell-aware tests. | Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada |
| 2014 | DDECS | Quality assurance in memory built-in self-test tools. | Albert Au, Artur Pogiel, Janusz Rajski, Piotr Sydow, Jerzy Tyszer, Justyna Zawada |