K. A. E. Totton
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
1986–1988
Best venue rank
C
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1988 | ICCD | Estimation of area and performance overheads for testable VLSI circuits. | J. R. Miles, Anthony P. Ambler, K. A. E. Totton |
| 1986 | ITC | Random Pattern Testability by Fast Fault Simulation. | A. J. Briers, K. A. E. Totton |