Skip to content

Kazutami Arimoto

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

10

Venues

6

Active years

1985–2017

Best venue rank

A*

Where they publish

Papers

10 indexed papers, newest first.

YearVenueTitleAuthors
2017PROFESTool Support for Consistency Verification of UML Diagrams.Salilthip Phuklang, Tomoyuki Yokogawa, Pattara Leelaprute, Kazutami Arimoto
2014DDECSThe LSI implementation of a memory based field programmable device for MCU peripherals.Tetsuya Matsumura, Naoya Okada, Yoshifumi Kawamura, Koji Nii, Kazutami Arimoto, Hiroshi Makino, Yoshio Matsuda
2013PRDCConsistency Verification of UML Diagrams Based on Process Bisimulation.Tomoyuki Yokogawa, Sousuke Amasaki, Keisuke Okazaki, Yoichiro Sato, Kazutami Arimoto, Hisashi Miyazaki
2011CVPRImplementation and evaluation of FAST corner detection on the massively parallel embedded processor MX-G.Yushi Moko, Yoshihiro Watanabe, Takashi Komuro, Masatoshi Ishikawa, Masami Nakajima, Kazutami Arimoto
2007ISCASEfficient Vertical/Horizontal-Space 1D-DCT Processing Based on Massive-Parallel Matrix-Processing Engine.Takeshi Kumaki, Tetsushi Koide, Hans Jrgen Mattausch, Yasuto Kuroda, Hideyuki Noda, Katsumi Dosaka, Kazutami Arimoto, Kazunori Saito
2005ISCASCAM-based VLSI architecture for Huffman coding with real-time optimization of the code word table [image coding example].Takeshi Kumaki, Yasuto Kuroda, Tetsushi Koide, Hans Jrgen Mattausch, Hideyuki Noda, Katsumi Dosaka, Kazutami Arimoto, Kazunori Saito
2001ITCTest cost reduction by at-speed BISR for embedded DRAMs.Yoshihiro Nagura, Michael Mullins, Anthony Sauvageau, Yoshinoro Fujiwara, Katsuya Furue, Ryuji Ohmura, Tatsunori Komoike, Takenori Okitaka, Tetsushi Tanizaki, Katsumi Dosaka, Kazutami Arimoto, Yukiyoshi Koda, Tetsuo Tada
1992ITCA Testing Technique for ULSI Memory with On-Chip Voltage Down Converter.Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikoshi, Katsunori Suma, Kazuyasu Fujishima
1989ITCA New Array Architecture for Parallel Testing in VLSI Memories.Yoshio Matsuda, Kazutami Arimoto, Masaki Tsukude, Tsukasa Oishi, Kazuyasu Fujishima
1985ITCTest Pattern Considerations for Fault Tolerant High Density DRAM.Hiroshi Miyamoto, Koichiro Mashiko, Yoshikazu Morooka, Kazutami Arimoto, Michihiro Yamada, Takao Nakano